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Electron Microscopy and Analysis 3rd edition


Electron Microscopy and Analysis 3rd edition

Paperback by Goodhew, Peter J. (University of Liverpool, Liverpool, England); Humphreys, John (The University of Manchester, England, UK); Beanland, Richard (GEC-Marconi Materials Technology, England, UK)

Electron Microscopy and Analysis

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ISBN:
9780748409686
Publication Date:
30 Nov 2000
Edition/language:
3rd edition / English
Publisher:
Taylor & Francis Ltd
Pages:
264 pages
Format:
Paperback
For delivery:
Estimated despatch 27 May - 1 Jun 2024
Electron Microscopy and Analysis

Description

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Contents

Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index

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